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May 03, 2024
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MEGR 8284 - Advanced Surface Metrology
Credit Hours: (3)
Constituents of surface texture, stylus, optical, atomic force microscope and other advanced methods of measuring surface texture. Two and three dimensional measurement of surfaces. Separation of form, waviness and roughness. Random process analysis techniques, use of transforms for filtering. Numerical evaluation of surface texture. Use of surface texture as fingerprint of the process. Relationship between function and surface texture. Credit will not be awarded for MEGR 8284 where credit has been awarded for MEGR 7284 .
Prerequisite(s): MEGR 6181 or permission of department.
Cross-listed as: MEGR 7284 , OPTI 6384 , and OPTI 8384 .
Most Recently Offered (Day): Fall 2016, Fall 2014
Most Recently Offered (Evening): Course has not been offered at this time in the past 3 years
Schedule of Classes
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