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May 09, 2024
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ECGR 5182 - Digital System Testing
Introduction to VLSI testing, test process and automatic test equipment, test economics and product quality, test economics, fault modeling, logic and fault simulation, testability measures, combinational and sequential circuit test generation, memory test, analog test, delay test, IDDQ test, design for testability, built-in self test, boundary scan, analog test bus, system test and core test. Credit will not be given for ECGR 5182 where credit has been given for ECGR 4182.
Credit Hours: (3)
Prerequisite(s): ECGR 3181 with a grade of C or above or permission of department.
Most Recently Offered (Day): Course has not been offered at this time in the past 3 years
Most Recently Offered (Evening): Course has not been offered at this time in the past 3 years
Schedule of Classes
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